Global Practice Head - Automotive Electronics, Tech Mahindra
30+ years experience in Embedded systems product and platform development primarily in the area of Automotive, Consumer Electronics and Avionics Built , managed highly technical competent global teams and managing the technology across the multiple geographic locationsAssociated with U-nextMasters Degree in Digital Electronics and Advanced communication.
Talks I've Given
Orthogonal Defect Classification Data for Improving Leading Metrics
Featuring Nagesh Shenoy
Leading indicators are the metrics providing us hint on the product quality during development cycle. Question is can we get them more accurate? We try to answer this question with Orthogonal Defect Classification (ODC).architecture
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